{"product_id":"rigol-nfp-3-near-field-probe-kit-30mhz-3ghz","title":"RIGOL NFP-3 Near-Field Probe Kit 30MHz–3GHz","description":"\u003cp\u003eThe RIGOL NFP-3 is a magnetic near-field probe kit covering 30MHz–3GHz for locating electromagnetic interference sources in electronic products. Used with a spectrum analyzer, it enables short-distance, non-contact investigation of magnetic fields around PCB traces, components, cables and assembled electronic modules.\u003c\/p\u003e\n\n\u003cp\u003eFour differently shaped H-field probes support both broad-area scanning and precise source localization. This allows engineers to identify the frequency and relative strength of interference components before moving to formal EMC compliance testing.\u003c\/p\u003e\n\n\u003ch3\u003eKey Features\u003c\/h3\u003e\n\n\u003cul\u003e\n  \u003cli\u003e\n\u003cstrong\u003e30MHz–3GHz frequency range:\u003c\/strong\u003e Covers common interference frequencies encountered during electronic product development and EMI troubleshooting.\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eFour magnetic near-field probes:\u003c\/strong\u003e Different sensing ranges and spatial resolutions support progressive scanning from general problem areas down to individual PCB traces.\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eShort-distance, non-contact measurement:\u003c\/strong\u003e Investigates magnetic leakage without requiring a direct electrical connection to the signal node.\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eEMI source localization:\u003c\/strong\u003e Helps determine where unwanted emissions originate and which spectral components are involved.\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003ePCB and cable diagnostics:\u003c\/strong\u003e Dedicated probes support examination of board-level magnetic fields and electromagnetic leakage from cables.\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eThin, electrically insulated construction:\u003c\/strong\u003e Facilitates measurements around daughterboards, components and other confined areas while reducing the risk of shorting exposed circuitry.\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003e50Ω measurement path:\u003c\/strong\u003e The probe terminals, RF cable and supplied adapter are designed for 50Ω spectrum-analyzer systems.\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eComplete connection accessories:\u003c\/strong\u003e Includes a 1000mm BNC-SMB RF cable and an N-BNC adapter for connection to a compatible analyzer input.\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003ch3\u003eProbe Differences \u0026amp; Selection\u003c\/h3\u003e\n\n\u003cul\u003e\n  \u003cli\u003e\n\u003cstrong\u003eNFP-3-P1 – Broad-area magnetic field search:\u003c\/strong\u003e Provides a sensing range within 10cm. Use it for initial scanning and quickly identifying the general location of a leakage field.\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eNFP-3-P2 – Focused leakage-field detection:\u003c\/strong\u003e Provides a sensing range within 3cm. Choose it after the P1 probe when a smaller area must be examined more accurately.\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eNFP-3-P3 – Cable leakage testing:\u003c\/strong\u003e Offers approximately 5mm spatial resolution and is intended for locating electromagnetic leakage along cables and wiring.\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eNFP-3-P4 – PCB trace localization:\u003c\/strong\u003e Offers approximately 2mm spatial resolution and detects magnetic fields in the vertical direction. It is the preferred probe for isolating emissions generated by individual PCB traces and closely spaced board components.\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003cp\u003eFor an efficient debugging workflow, begin with the P1 probe to scan a larger area, narrow the location with the P2 probe, and then use the P3 or P4 probe according to whether the suspected source is a cable or a PCB-level structure.\u003c\/p\u003e\n\n\u003ch3\u003eTypical Applications\u003c\/h3\u003e\n\n\u003cul\u003e\n  \u003cli\u003eLocating radiated EMI sources during product development\u003c\/li\u003e\n  \u003cli\u003eEMC pre-compliance troubleshooting\u003c\/li\u003e\n  \u003cli\u003eIdentifying noisy PCB traces and components\u003c\/li\u003e\n  \u003cli\u003eExamining switching power supplies and converters\u003c\/li\u003e\n  \u003cli\u003eTesting electromagnetic leakage from cables\u003c\/li\u003e\n  \u003cli\u003eInvestigating coupling paths between electronic modules\u003c\/li\u003e\n  \u003cli\u003eComparing the frequency and relative strength of interference sources\u003c\/li\u003e\n  \u003cli\u003eEvaluating shielding improvements and enclosure leakage\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003ch3\u003eConnection and Measurement\u003c\/h3\u003e\n\n\u003cp\u003eEach probe uses an SMB male terminal. The supplied BNC-SMB RF cable connects the selected probe to the BNC female side of the included adapter, while the adapter’s N male connector attaches to the spectrum analyzer RF input.\u003c\/p\u003e\n\n\u003cp\u003eMeasurements are performed by moving the selected probe close to the device under test while observing the spectrum-analyzer display. Probe position, orientation and distance affect the relative signal level and should be kept consistent when comparing different locations or design revisions.\u003c\/p\u003e\n\n\u003ch3\u003eTechnical Specifications\u003c\/h3\u003e\n\n\u003cul\u003e\n  \u003cli\u003e\n\u003cstrong\u003eFrequency range:\u003c\/strong\u003e 30MHz–3GHz\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eProbe type:\u003c\/strong\u003e Magnetic near-field probes\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eNumber of probes:\u003c\/strong\u003e 4\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eProbe connector:\u003c\/strong\u003e SMB male\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eSystem impedance:\u003c\/strong\u003e 50Ω\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eRF cable:\u003c\/strong\u003e BNC male to SMB female, 1000mm\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eAdapter:\u003c\/strong\u003e N male to BNC female\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eOperating temperature:\u003c\/strong\u003e 0–50°C\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003eStorage temperature:\u003c\/strong\u003e -20–70°C\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003ePackaged dimensions:\u003c\/strong\u003e 260×190×30mm\u003c\/li\u003e\n  \u003cli\u003e\n\u003cstrong\u003ePackaged weight:\u003c\/strong\u003e 0.425kg\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003ch3\u003ePackage Contents\u003c\/h3\u003e\n\n\u003cul\u003e\n  \u003cli\u003eNFP-3-P1 magnetic near-field probe\u003c\/li\u003e\n  \u003cli\u003eNFP-3-P2 magnetic near-field probe\u003c\/li\u003e\n  \u003cli\u003eNFP-3-P3 magnetic near-field probe\u003c\/li\u003e\n  \u003cli\u003eNFP-3-P4 magnetic near-field probe\u003c\/li\u003e\n  \u003cli\u003e1000mm BNC-SMB RF cable\u003c\/li\u003e\n  \u003cli\u003eN male to BNC female adapter\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003ch3\u003eWhy Choose the RIGOL NFP-3?\u003c\/h3\u003e\n\n\u003cp\u003eThe NFP-3 combines four complementary magnetic probes in one kit, enabling engineers to move from broad EMI scanning to precise PCB- or cable-level localization without changing measurement systems. It is suitable for R\u0026amp;D laboratories, embedded-system development, power-electronics debugging, product verification and EMC pre-compliance investigation.\u003c\/p\u003e","brand":"RIGOL","offers":[{"title":"Default Title","offer_id":54642265587991,"sku":null,"price":459.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/1014\/1414\/2231\/files\/RIGOL_NFP-3.webp?v=1786356468","url":"https:\/\/aimitek.eu\/products\/rigol-nfp-3-near-field-probe-kit-30mhz-3ghz","provider":"Aimitek","version":"1.0","type":"link"}